Reflectance Cell Holder

This is a measurement method that calculates the relative reflectance (%) by comparing the intensity of light that undergoes specular reflection from the sample surface against light reflected from a reference sample.

An aluminum-coated Standard Mirror is set as the 100% reflectance reference, and the reflective characteristics of the sample are quantitatively evaluated through the light intensity ratio reflected from the sample. This method is highly sensitive to surface condition, film thickness, and coating uniformity, making it ideal for comparative and evaluation purposes rather than absolute reflectance.

Measurement Angle (Incident Angle) and Polarization Effects

Specular reflectance measurement has the advantage of being minimally affected by polarization as the incident angle decreases. Generally, an incident angle in the range of 5°~10° is commonly used.

Application Fields

While an Integrating Sphere collects all reflected light, this accessory selectively measures only the specular reflection component, enabling more sensitive analysis of surface characteristics.

  • Semiconductor and optical material evaluation
  • Analysis of reflective properties of metal coating films and metal conductive layers
  • Thin film coating uniformity and quality comparison
  • Relative reflectance evaluation of mirrors and reflective coating materials

Configuration & Features

  • Reference / Sample separated structure
  • Aluminum-deposited Standard Mirror included (2 pcs)
  • Accessory adapter included
  • Optical structure optimized for relative reflectance measurement

Specifications

Wavelength Range

200 – 1,000 nm

Sample Size

Sample: Min. 10 × 10 mm / Max. 100 × 120 mm
Reference: Min. 10 × 10 mm / Max. 25 × 25 mm

Beam Port Size

7 × 7 mm

Angle of Incidence

Approx. 10°

Reflection Reference

Aluminum-deposited plane mirror (Standard mirror)

Repeatability

< 0.002

Stability

< 0.002

Measurable Reflectance Range

0 – 100%

Measurement Resolution

Same as the connected spectrophotometer

Polarization Dependency

Negligible

Stray Light Influence

Negligible

(*) Compatible Products

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