Alpha
(Double-beam)
Alpha is a double-beam spectrophotometer designed to minimize measurement errors caused by light source fluctuations over time.
Unlike single-beam systems, it uses separate optical paths to simultaneously measure the reference and sample, providing improved accuracy and measurement stability.
Overview – Alpha

Alpha (Double-Beam UV-Vis Spectrophotometer)
Alpha is a UV-Vis spectrophotometer that precisely measures transmittance and absorbance across a wide wavelength range, providing reliable quantitative data such as concentration and purity.
It is suitable for a wide range of applications, from routine analysis to advanced research, and is widely used in environmental testing, biotechnology, and chemical analysis.
Alpha supports four measurement modes—Photometric, Quantitation, Spectrum, and Kinetics—and includes embedded software with an intuitive touchscreen interface for efficient operation.
Its advanced optical design and micro-stepping control technology provide stable and accurate measurements.
Designed for Everyday Laboratory Use
Alpha is designed to meet the needs of modern laboratories by providing accuracy, stability, and operational efficiency.
Its intuitive interface and advanced optical design provide precise and reliable measurements with minimal user training. It is well suited for routine analysis and research.
Key Benefits
User Convenience
PC-level functionality with fast and intuitive operation without an external computer.
Fast Analysis
Fast, flexible software with up to 1.5× faster analysis than conventional systems.
Compact Design
Compact, space-efficient design for efficient laboratory space utilization.
Rapid Technical Support
Fast, reliable technical support with in-house design and manufacturing
Broad Measurement Capability
High-precision, high-resolution measurements across the UV-Vis range for a wide range of applications.
Choose the Right Spectrophotometer for Your Needs
Alpha
Designed for research and demanding analytical applications, Alpha combines advanced performance with intuitive operation.
A double-beam optical system minimizes measurement errors caused by light source fluctuations, providing highly accurate and repeatable results.
POP
Designed for simplicity and efficiency in everyday laboratory work.
A single-beam optical system provides fast, straightforward measurements for routine analysis, education, and high-throughput applications.
|
Alpha |
POP |
|
|
Measurement Method |
Double-beam |
Single-beam |
|
Application |
Research / QC |
Routine / Education |
|
Stability |
Excellent |
Basic |
|
Spectral Bandwidth |
1.0 nm |
< 1.8 nm |
|
Wavelength Accuracy |
<± 0.3 nm (For entire range) <± 0.1 nm (at 656.1 nm) |
< ±0.5 nm |
|
Photometric Range |
Abs −4 to +4 |
Abs −3 to +3 |
|
Data Reliability |
High reproducibility |
Standard |
|
Cell Holder |
Multi-cell (8 cells) |
Multi-cell (8 cells) |
|
Display |
7-inch (1280 × 800) |
7-inch (1280 × 800) |
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Weight |
10.5 kg |
10.5 kg |
|
Price Position (vs. POP) |
100% |
~85–90% |
Typical Applications
Performance & Technology
Wavelength accuracy & repeatability

The system provides wavelength accuracy of ±0.3 nm and wavelength repeatability of ±0.1 nm across the wavelength range of 190–1100 nm.
Spectral accuracy and peak performance are verified using a NIST-traceable Holmium Oxide Glass filter.
Measured values at multiple reference wavelengths closely match the specified standards, with all test points meeting the acceptance criteria.
Baseline Flatness

Baseline flatness is maintained within ±0.00025 Abs over the wavelength range of 200–1100 nm, providing stable and reliable measurement performance.
The measured peak-to-peak baseline variation is 0.00002 Abs, well below the tolerance of ±0.0005 Abs.
Noise

The system meets the specified noise performance criteria, with RMS values of ≤ 0.05 mAbs at 700 nm and ≤ 0.4 mAbs at 240 nm, providing stable and reliable measurements across the wavelength range.
At 700 nm (tungsten-halogen lamp), the measured noise level is 0.03 mAbs (peak-to-peak) and 0.008 mAbs (RMS), well below the specified limits of ≤ 0.30 mAbs (P-P) and ≤ 0.05 mAbs (RMS).
At 240 nm (deuterium lamp), the measured noise level is 0.07 mAbs (peak-to-peak) and 0.022 mAbs (RMS), well below the specified limits of ≤ 2.4 mAbs (P-P) and ≤ 0.4 mAbs (RMS).
The measured values meet the specified noise performance criteria across both wavelength conditions.
Performance Validation
Alpha provides reliable measurement performance through verified baseline stability and photometric accuracy.
Baseline flatness is maintained within ±0.00025 Abs over the wavelength range of 200–1,100 nm, with a measured peak-to-peak variation of just 0.00002 Abs—well below the tolerance of ±0.0005 Abs. This provides stable baseline performance for precise absorbance measurements.
Photometric accuracy has been validated using a NIST-traceable potassium dichromate standard (SRM 935a), achieving an accuracy of ±0.005 Abs at 1.0 Abs. In addition, repeated measurements confirm excellent repeatability, with a standard deviation of 0.000009 Abs.
These results confirm reliable measurement performance across a wide range of applications.


Measurement Modes & Analytical Capability
Alpha integrates multiple analytical modes into a single, intuitive platform:

Photometric Mode
Measures absorbance or transmittance at selected wavelengths

Spectrum Mode
Acquires full spectra across user-defined wavelength ranges

Quantitation Mode
Performs concentration analysis using calibration curves

Kinetics Mode
Monitors time-dependent absorbance changes
These modes support a wide range of analytical applications, from routine measurements to advanced kinetic studies.
Built-In Test (BIT)

The system automatically performs a self-diagnostic check upon power-up, verifying the status of key components, including the CPU, memory, motors, lamps, and calibration.
The results are displayed for each item, enabling quick verification of system status.
Self-diagnostic items include CPU & Memory, the wavelength motor, cell motor, filter motor, lamp motor, tungsten lamp, and deuterium lamp.
Software Solution
Alpha offers an integrated software ecosystem that supports the complete analytical workflow, from measurement and data processing to reporting and compliance.
The system combines intuitive instrument control with data management and regulatory support, providing a unified environment for analysis, data management, and data integrity.

View is Windows-based software for instrument control and data management in a familiar desktop environment.
It supports the complete workflow from real-time measurement and data analysis to post-processing and report generation.

Secure is optional compliance software that provides full traceability and data integrity for regulated environments.
It records and monitors user activities in conjunction with View, supporting compliance with FDA 21 CFR Part 11 requirements.
Specifications
Photometrics System
Double-beam type
Light Source(s)
Tungsten-Halogen Lamp & Deuterium Lamp
(Built-in automatic lamp switching mechanism)
Detector
Silicon Photodiode
Spectral Bandwidth
1.0 nm (190 to 1,100 nm)
Wavelength Range
190 to 1,100 nm
Wavelength Display (setting)
0.05 nm
Wavelength Accuracy
<± 0.3 nm (For entire range)
<± 0.1 nm (at 656.1 nm)
Wavelength Repeatability
<± 0.1 nm
Wavelength Slew Rate
25,000 nm/min
Scanning Speed(Max)
6,000 nm/min
Lamp interchange Wavelength
340 to 410 nm (Default 370 nm)
Photometric Range
4 Abs
Photometric Display
Absorbance: -4 A to 4 A
Transmittance: 0% to 400%
Photometric Accuracy
<± 0.002 Abs (0 to 0.5 Abs)
<± 0.004 Abs (0.5 to 1 Abs)
<± 0.006Abs (1 to 2 Abs)
(NIST SRM 930d/1930 or equivalent)
Environmental requirements
Temperature: 15 °C to 35 °C
Humidity: 30 % to 80 %
Baseline Stability
< 0.0003 Abs/h
(700 nm, after one hour warm-up)
Baseline Flatness
< 0.0005 Abs RMS
(190 to 1,100 nm, after one hour warm-up)
Photometric Repeatability
± 0.0002Abs at 0.5 Abs
± 0.0006Abs at 1.0 Abs
± 0.0010Abs at 2.0 Abs
Stray Light
< 1.00 % (at 198 nm with 1.2% KCl)
< 0.05 % (at 220 nm with 0.1% NaI)
< 0.05 % (at 340 nm with 0.5% NaNO2)
Photometric noise
< 0.00005 Abs RMS (at 700 nm)
Monochromator
Czerny-Turner type with 1,200 lines/nm blazed grating
Standard Cell Holder
Automatic Rotary type 8-position Multi-Cell Holder
Operating System (OS)
Windows 10 (Embedded PC)
Display
8 inch color LCD with touch screen
Control Options
Stand-alone, PC
Dimensions(W*D*H)
520 × 500 × 200 mm
Power Requirement
AC 100-240 V, 50/60 Hz, 140 VA
Weight
14 kg
PC Software
(optional) View for advanced measurement
(optional) Secure for FDA 21 CFR Part 11 compliance
Connectivity
RJ45 ethernet, USB A type * 2, RS-232 * 1, USB B type * 1
Support
Downloads
Applications
Troubleshooting
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Request a Quote.
Whether you’re exploring options or ready to move forward, our team is here to help. Contact your local dealer or submit a quote request and we’ll provide a competitive offer based on your specific requirements.
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